Much like the traditional scanning electron microscope (SEM), the field emission scanning electron microscope uses electrons to illuminate a sample, instead of visible light as is used in optical ...

green STEM probes are labeled for regions of the sample with one layer, vacuum, and two layers. (Image: Microscopy and Microanalysis, Volume 25, Issue 3, June 2019, pp. 563-582, CC BY 4.0) In 4D-STEM, ...

The FEI Philips XL 40 Environmental Scanning Microscope (ESEM) is a large-chamber, tungsten source, environmental scanning electron microscope capable of high and low vacuum imaging. The FEI Philips ...

The efforts of microscopists have given aberration-corrected transmission electron microscopy the power to reveal atomic structures with unprecedented precision. It is now up to materials ...

The 3D electron microscopy imaging is available using Serial Block Face (SB-EM) and Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) or Electron Tomography (ET) Electron tomography is TEM based ...