It contrasts traditional graphic art production with modern computer-generated methods, showcasing the tools and processes involved in creating various graphics, including charts and animations.

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Several small seasonal runoff gullies are developed on both sides and along the slope body, with no flow observed during the investigation ... some of the images that are de-correlated in D-InSAR ...